Deutsch
 
Hilfe Datenschutzhinweis Impressum
  DetailsucheBrowse

Datensatz

DATENSATZ AKTIONENEXPORT
  Local Characterization of Ultrathin ZnO Layers on Ag(111) by Scanning Tunneling Microscopy and Atomic Force Microscopy

Shiotari, A., Liu, B. H., Jaekel, S., Grill, L., Shaikhutdinov, S. K., Freund, H.-J., et al. (2014). Local Characterization of Ultrathin ZnO Layers on Ag(111) by Scanning Tunneling Microscopy and Atomic Force Microscopy. The Journal of Physical Chemistry C, 118(47), 27428-27435. doi:10.1021/jp509013p.

Item is

Externe Referenzen

einblenden:

Urheber

einblenden:
ausblenden:
 Urheber:
Shiotari, Akitoshi1, 2, Autor           
Liu, Bo Hong3, Autor           
Jaekel, Simon1, Autor           
Grill, Leonhard1, 4, Autor           
Shaikhutdinov, Shamil K.3, Autor           
Freund, Hans-Joachim3, Autor           
Wolf, Martin1, Autor           
Kumagai, Takashi1, Autor           
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
2Department of Chemistry, Graduate School of Science, Kyoto University, Kitashirakawa-Oiwake-cho, 606-8502 Kyoto, Japan, ou_persistent22              
3Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
4Universität Graz, ou_persistent22              

Inhalt

einblenden:
ausblenden:
Schlagwörter: -
 Zusammenfassung: We have studied the local structure of ultrathin ZnO layers grown on Ag(111) by the reactive deposition method using low-temperature scanning tunneling microscopy (STM) and noncontact atomic force microscopy (nc-AFM) at 5 K. The characteristic Moiré patterns arising from the lattice mismatch between the ZnO(0001) layers and Ag(111) appear in STM, but it is not pronounced in nc-AFM images. This indicates an atomically flat geometrical structure of the ZnO layer and a dominant contribution of the electronic state to the Moiré patterns imaged by STM. We found that the apparent height of STM for the ZnO layers strongly depends on the bias voltage and becomes comparable with that of nc-AFM when the bias voltage is below the conduction band edge of the ZnO layers. The ZnO layers with the STM (AFM) apparent height of 3.8 (4.0) ± 0.3 and 5.8 (6.1) ± 0.3 Å were observed. On the other hand, mapping the onset of the resonance state of the ZnO layer by scanning tunneling spectroscopy provides a basis for determining its thickness. Our results suggest that the ZnO layers on Ag(111) grow predominantly as bi- and trilayers under the conditions used.

Details

einblenden:
ausblenden:
Sprache(n): eng - English
 Datum: 2014-10-152014-09-052014-11-042014-11-042014-11-26
 Publikationsstatus: Erschienen
 Seiten: 8
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1021/jp509013p
 Art des Abschluß: -

Veranstaltung

einblenden:

Entscheidung

einblenden:

Projektinformation

einblenden:

Quelle 1

einblenden:
ausblenden:
Titel: The Journal of Physical Chemistry C
  Andere : J. Phys. Chem. C
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Washington DC : American Chemical Society
Seiten: - Band / Heft: 118 (47) Artikelnummer: - Start- / Endseite: 27428 - 27435 Identifikator: ISSN: 1932-7447
CoNE: https://pure.mpg.de/cone/journals/resource/954926947766