Joint Characterization of Crystallography and Chemistry on the Nanometer Scale 
by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, Michael

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Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography

Herbig, M. (2014). Joint Characterization of Crystallography and Chemistry on the Nanometer Scale by Correlative Electron Microscopy and Atom Probe Tomography. Talk presented at Seminar talk at the Institut für Metallkunde und Metallphysik, RWTH Aachen. Aachen, Germany. 2014-10-21.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-52FC-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-52FD-F

Genre: Talk

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Creators:
Herbig, Michael¹, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384

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Language(s): eng - English

Dates: Created: 2014

Publication Status: Not specified

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Title: Seminar talk at the Institut für Metallkunde und Metallphysik, RWTH Aachen

Place of Event: Aachen, Germany

Start-/End Date: 2014-10-21

Invited: Yes

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