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  Microstructure and Residual Stress Formation in Oxide Layers Grown in High Niobium Containing g-TiAl Based Alloy

Silva, P., Pinto, H., Kostka, A., Chladil, H. F., & Pyzalla, A. (2006). Microstructure and Residual Stress Formation in Oxide Layers Grown in High Niobium Containing g-TiAl Based Alloy. Poster presented at SNI 2006, German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities, Hamburg, Germany.

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 Creators:
Silva, P.1, Author           
Pinto, H.2, Author           
Kostka, A.3, Author           
Chladil, H. F., Author
Pyzalla, A.4, Author           
Affiliations:
1Metallurgy, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863364              
2Materials Testing, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863363              
3Microstructure Characterization, Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863365              
4Material Diagnostics and Steel Technology, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863361              

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 Identifiers: eDoc: 289514
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Title: SNI 2006, German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities
Place of Event: Hamburg, Germany
Start-/End Date: 2006-10-04 - 2006-10-06

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