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  In-plane microwave conductivity of the single-layer cuprate Tl2Ba2CuO6+δ

Broun, D., Morgan, D., Ormeno, R., Lee, S., Tyler, A., Mackenzie, A. P., et al. (1997). In-plane microwave conductivity of the single-layer cuprate Tl2Ba2CuO6+δ. Physical Review B, 56(18), R11443-R11446. doi:10.1103/PhysRevB.56.R11443.

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Broun, D.M.1, Author
Morgan, D.C.1, Author
Ormeno, R.J.1, Author
Lee, S.F.1, Author
Tyler, A.W.1, Author
Mackenzie, A. P.2, Author           
Waldram, J.R.1, Author
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1external, ou_persistent22              
2External Organizations, ou_persistent22              

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 Abstract: We have measured the in-plane microwave conductivity of nearly optimally doped single crystals (Tc=78 K) of Tl2Ba2CuO6+δ (Tl-2201) at 14.4, 24.8, and 35.9 GHz using cavity perturbation methods. At low temperatures, the in-plane penetration depth has a strong, linear temperature dependence, indicative of an unconventional pairing state with line nodes. The real part of the conductivity shows a broad, frequency-dependent peak near 30 K, similar to that seen in YBa2Cu3O7-δ and Bi2Sr2CaCu2O8 crystals. With tetragonal crystal symmetry and a single CuO2 plane per unit cell, Tl-2201 is the simplest structure so far to display these features.

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 Dates: 1997-11-01
 Publication Status: Issued
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 Identifiers: DOI: 10.1103/PhysRevB.56.R11443
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Title: Physical Review B
  Other : Phys. Rev. B
Source Genre: Journal
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Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 56 (18) Sequence Number: - Start / End Page: R11443 - R11446 Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008