A Method to Overcome the Problem of Small Sample Tilts in Light Element 
Electron Microprobe Analysis

Mackenzie, A. P.

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A Method to Overcome the Problem of Small Sample Tilts in Light Element Electron Microprobe Analysis

Mackenzie, A. P. (1990). A Method to Overcome the Problem of Small Sample Tilts in Light Element Electron Microprobe Analysis. In Proceedings of the XIIth International Conference on Electron Microscopy (pp. 221). San Francisco Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-E855-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-E857-6

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Mackenzie, A. P.¹, Author

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Dates: Date issued: 1990-01-01

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Title: Proceedings of the XIIth International Conference on Electron Microscopy

Source Genre: Proceedings

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Publ. Info: San Francisco Press

Pages: - Volume / Issue: 2 Sequence Number: - Start / End Page: 221 Identifier: -