Transmission electron microscopy of fluorapatite-gelatine composite particles 
prepared using focused ion beam milling

Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.

doi:10.1111/j.0022-2720.2004.01352.x

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Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling

Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy, 214, 208-212. doi:10.1111/j.0022-2720.2004.01352.x.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2DE6-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-BE98-B

Genre: Journal Article

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Creators:
Volkert, C. A., Author
Busch, S.¹, Author
Heiland, B., Author
Dehm, G., Author

Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404

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Free keywords: apatite; FIB; focused ion beam milling; TEM sample preparation; tooth enamel; ultramicrotomy

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Language(s): eng - English

Dates: Date issued: 2004-06

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 220192
ISI: 000221536000002
DOI: 10.1111/j.0022-2720.2004.01352.x

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Title: Journal of Microscopy

Alternative Title : J. Microsc.-Oxf.

Source Genre: Journal

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Pages: - Volume / Issue: 214 Sequence Number: - Start / End Page: 208 - 212 Identifier: ISSN: 0022-2720