Transmission Electron Microscopy and High-Resolution Electron Microscopy 
Investigation of the Microstructure of an YNi2B2C Thin Film

Cao, G. H.; Skrotzki, W.; Simon, P.; Wimbush, S. C.; Holzapfel, B.

doi:10.1021/cm050006t

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Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi₂B₂C Thin Film

Cao, G. H., Skrotzki, W., Simon, P., Wimbush, S. C., & Holzapfel, B. (2005). Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi₂B₂C Thin Film. Chemistry of Materials, 17, 3558-3562. doi:10.1021/cm050006t.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2CC3-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-EC7B-1

Genre: Journal Article

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Creators:
Cao, G. H., Author
Skrotzki, W., Author
Simon, P.¹, Author
Wimbush, S. C., Author
Holzapfel, B., Author

Affiliations:
1Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863418

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

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Identifiers: eDoc: 241958
DOI: 10.1021/cm050006t

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Title: Chemistry of Materials

Source Genre: Journal

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Pages: - Volume / Issue: 17 Sequence Number: - Start / End Page: 3558 - 3562 Identifier: -