Relationship between composition and charge carrier concentration in Eu8Ga16-xGe
30+x clathrates

Pacheco, V.; Bentien, A.; Carrillo-Cabrera, W.; Paschen, S.; Steglich, F.; Grin, Y.

doi:10.1103/PhysRevB.71.165205

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Relationship between composition and charge carrier concentration in Eu₈Ga_16-xGe_30+x clathrates

Pacheco, V., Bentien, A., Carrillo-Cabrera, W., Paschen, S., Steglich, F., & Grin, Y. (2005). Relationship between composition and charge carrier concentration in Eu₈Ga_16-xGe_30+x clathrates. Physical Review B, 71, 165205-1-165205-10. doi:10.1103/PhysRevB.71.165205.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2C57-B Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-EA58-0

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Urheber:
Pacheco, V.¹, Autor
Bentien, A.¹, Autor
Carrillo-Cabrera, W.¹, Autor
Paschen, S.¹, Autor
Steglich, F.², Autor
Grin, Y.³, Autor

Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404
2Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467
3Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863413