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  Electron Microscopy and Holography of Nanobricks of Si and Ge Clathrates

Simon, P., Carrillo-Cabrera, W., Zhongjia, T., Chiong, K., Baitinger, M., Grin, Y., et al. (2010). Electron Microscopy and Holography of Nanobricks of Si and Ge Clathrates. Nanofair 2010 - 8th International Nanotechnology Symposium, Session analytics I.

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 Creators:
Simon, P.1, Author           
Carrillo-Cabrera, W.2, Author           
Zhongjia, T., Author
Chiong, K., Author
Baitinger, M.3, Author           
Grin, Y.4, Author           
Guloy, A. M.2, Author           
Affiliations:
1Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863418              
2Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404              
3Michael Baitinger, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863416              
4Juri Grin, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863413              

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Language(s): eng - English
 Dates: 2010-03-01
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 537451
URI: http://www.nanofair.com/
 Degree: -

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Title: Nanofair 2010 - 8th International Nanotechnology Symposium
Place of Event: Dresden
Start-/End Date: 2010-07-06 - 2010-07-07

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Title: Nanofair 2010 - 8th International Nanotechnology Symposium
Source Genre: Journal
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Publ. Info: -
Pages: CD-ROM Volume / Issue: - Sequence Number: Session analytics I Start / End Page: - Identifier: -