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  Profiling structured beams using injected aerosols

Loh, N. D., Starodub, D., Lomb, L., Hampton, C. Y., Martin, A. V., Sierra, R. G., et al. (2012). Profiling structured beams using injected aerosols. In Proceedings of SPIE. SPIE © 1962 - 2013. All Rights Reserved. doi:doi:10.1117/12.930075.

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Urheber

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 Urheber:
Loh, N. D., Autor
Starodub, Dmitri, Autor
Lomb, Lukas, Autor
Hampton, Christina Y., Autor
Martin, Andrew V., Autor
Sierra, Raymond G., Autor
Barty, Anton, Autor
Aquila, Andrew, Autor
Schulz, Joachim, Autor
Steinbrener, Jan, Autor
Shoeman, Robert L., Autor
Kassemeyer, Stephan, Autor
Bostedt, Christoph, Autor
Bozek, John, Autor
Epp, Sascha W.1, Autor           
Erk, Benjamin2, Autor           
Hartmann, Robert, Autor
Rolles, Daniel2, Autor           
Rudenko, Artem1, Autor           
Rudek, Benedikt2, Autor           
Foucar, Lutz2, Autor           Kimmel, Nils, AutorWeidenspointner, Georg, AutorHauser, Günther, AutorHoll, Peter, AutorPedersoli, Emanuele, AutorLiang, MengNing, AutorHunter, Mark S., AutorGumprecht, Lars, AutorCoppola, Nicola, AutorWunderer, Cornelia, AutorGraafsman, Heinz, AutorMaia, Filipe R. N. C., AutorEkeberg, Tomas, AutorHantke, Max, AutorFleckenstein, Holger, AutorHirsemann, Helmut, AutorNass, Karol, AutorWhite, Thomas A., AutorTobias, Herbert J., AutorFarquar, George R., AutorBenner, W. Henry, AutorHau-Riege, Stefan, AutorReich, Christian, AutorHartmann, Andreas, AutorSoltau, Heike, AutorMarchesini, Stefano, AutorBajt, Sasa, AutorBarthelmess, Miriam, AutorStrueder, Lothar, AutorUllrich, Joachim3, Autor           Bucksbaum, Philip, AutorHodgson, Keith O., AutorFrank, Mathias, AutorSchlichting, Ilme, AutorChapman, Henry N., AutorBogan, Michael J., Autor mehr..
Affiliations:
1External Organizations, ou_persistent22              
2Department of Biomolecular Mechanisms, ou_1497700              
3Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

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 Zusammenfassung: Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied. © (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.

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Sprache(n): eng - English
 Datum: 2012-10-19
 Publikationsstatus: Online veröffentlicht
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: DOI: doi:10.1117/12.930075
 Art des Abschluß: -

Veranstaltung

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Titel: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Veranstaltungsort: San Diego, California, USA
Start-/Enddatum: 2012-08-13 - 2012-08-16

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Quelle 1

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Titel: Proceedings of SPIE
Genre der Quelle: Konferenzband
 Urheber:
Moeller, Stefan P., Autor
Yabashi, Makina, Autor
Hau-Riege, Stefan P.1, Autor           
Affiliations:
1 External Organizations, ou_persistent22            
Ort, Verlag, Ausgabe: SPIE © 1962 - 2013. All Rights Reserved
Seiten: - Band / Heft: 8504 Artikelnummer: 850403 Start- / Endseite: - Identifikator: CoNE: https://pure.mpg.de/cone/journals/resource/111097776606042