Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface 
Structures and Surface Solvation

Campen, Kramer

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Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface Structures and Surface Solvation

Campen, K. (2013). Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface Structures and Surface Solvation. Talk presented at Integrated Research Training Group Seminar on Elementary Processes in Molecular Switches: Collaborative Research Center 658, Technische Universität. Berlin, Germany. 2013-03.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-56C3-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-570F-5

Genre: Talk

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Creators:
Campen, Kramer¹, Author

Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546

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Title: Integrated Research Training Group Seminar on Elementary Processes in Molecular Switches: Collaborative Research Center 658, Technische Universität

Place of Event: Berlin, Germany

Start-/End Date: 2013-03

Invited: Yes

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