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  Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

Kempenaers, L., Janssens, K., Jochum, K. P., Vincze, L., Vekemans, B., Somogyi, A., et al. (2003). Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF. Journal of Analytical Atomic Spectrometry, 18(4), 350-357.

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Genre: Journal Article
Alternative Title : J. Anal. At. Spectrom.

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 Creators:
Kempenaers, L., Author
Janssens, K., Author
Jochum, K. P.1, Author           
Vincze, L., Author
Vekemans, B., Author
Somogyi, A., Author
Drakopoulos, M., Author
Adams, F., Author
Affiliations:
1Geochemistry, Max Planck Institute for Chemistry, Max Planck Society, ou_1826288              

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Language(s): eng - English
 Dates: 2003
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 120095
ISI: 000181827800010
 Degree: -

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Title: Journal of Analytical Atomic Spectrometry
  Alternative Title : J. Anal. At. Spectrom.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 18 (4) Sequence Number: - Start / End Page: 350 - 357 Identifier: ISSN: 0267-9477