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  Generalized intrinsic symmetry detection

Berner, A., Bokeloh, M., Wand, M., Schilling, A., & Seidel, H.-P.(2009). Generalized intrinsic symmetry detection (MPI-I-2009-4-005). Saarbrücken: Max-Planck-Institut für Informatik.

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Berner, Alexander1, Author           
Bokeloh, Martin1, Author           
Wand, Martin2, Author
Schilling, Andreas2, Author
Seidel, Hans-Peter1, Author           
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1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              
2External Organizations, ou_persistent22              

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 Abstract: In this paper, we address the problem of detecting partial symmetries in 3D objects. In contrast to previous work, our algorithm is able to match deformed symmetric parts: We first develop an algorithm for the case of approximately isometric deformations, based on matching graphs of surface feature lines that are annotated with intrinsic geometric properties. The sensitivity to non-isometry is controlled by tolerance parameters for each such annotation. Using large tolerance values for some of these annotations and a robust matching of the graph topology yields a more general symmetry detection algorithm that can detect similarities in structures that have undergone strong deformations. This approach for the first time allows for detecting partial intrinsic as well as more general, non-isometric symmetries. We evaluate the recognition performance of our technique for a number synthetic and real-world scanner data sets.

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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: 33 p.
 Publishing info: Saarbrücken : Max-Planck-Institut für Informatik
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 Identifiers: URI: http://domino.mpi-inf.mpg.de/internet/reports.nsf/NumberView/2009-4-005
Report Nr.: MPI-I-2009-4-005
BibTex Citekey: BernerBokelohWandSchillingSeidel2009
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Title: Research Report / Max-Planck-Institut für Informatik
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