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  Stabilization of semiconductor surfaces through bulk dopants

Moll, N., Xu, Y., Hofmann, O. T., & Rinke, P. (2013). Stabilization of semiconductor surfaces through bulk dopants. New Journal of Physics, 15(8): 083009. doi:10.1088/1367-2630/15/8/083009.

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 Creators:
Moll, Nikolaj1, Author
Xu, Yong2, Author           
Hofmann, Oliver T.2, Author           
Rinke, Patrick2, Author           
Affiliations:
1IBM Research—Zurich, 8803 Rüschlikon, Switzerland., ou_persistent22              
2Theory, Fritz Haber Institute, Max Planck Society, ou_634547              

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 Abstract: We show by employing density-functional theory (DFT) calculations (including a hybrid functional) that ZnO surfaces can be stabilized by bulk dopants. As an example, we study the bulk-terminated ZnO (0001) surface covered with half a monolayer of hydrogen. We demonstrate that deviations from this half-monolayer coverage can be stabilized by electrons or holes from bulk dopants. The electron chemical potential therefore becomes a crucial parameter that cannot be neglected in semiconductor surface studies. As one result, we nd that to form the defect-free surface with a half-monolayer coverage of hydrogen for n-type ZnO, ambient hydrogen background pressures are more conducive than high vacuum pressures.

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Language(s): eng - English
 Dates: 2013-04-262013-07-162013-08-05
 Publication Status: Published online
 Pages: 11
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1088/1367-2630/15/8/083009
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Title: New Journal of Physics
  Other : New J. Phys.
Source Genre: Journal
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Publ. Info: Bristol, UK : Institute of Physics Pub.
Pages: - Volume / Issue: 15 (8) Sequence Number: 083009 Start / End Page: - Identifier: ISSN: 1367-2630
CoNE: https://pure.mpg.de/cone/journals/resource/954926913666