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  Failure Diagnosis and Recovery based on DES Framework

Son, H. (2004). Failure Diagnosis and Recovery based on DES Framework. In IEEE International Conference on Mechatronics (ICM '04) (pp. 255-260). Piscataway, NJ, USA: IEEE Operations Center.

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 Creators:
Son, HI1, Author           
Affiliations:
1Department Human Perception, Cognition and Action, Max Planck Institute for Biological Cybernetics, Max Planck Society, ou_1497797              

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 Abstract: As many industrial systems become complex, it is very difficult to identify the cause of failures. This paper presents a new failure diagnosis approach based on discrete-event systems (DES) framework. In particular, the approach is a hybrid of event-based and state-based ones leading to a simpler failure diagnoser with supervisory control capability. In our approach, we include the failure recovery events for failures in the system model in order to derive a diagnoser we refer to as a recoverable diagnoser. Further, in order to reduce the state size of the recoverable diagnoser, a procedure to construct a high-level diagnoser is presented.

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 Dates: 2004-06
 Publication Status: Issued
 Pages: -
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 Rev. Type: -
 Identifiers: ISBN: 0-7803-8599-3
URI: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=arnumber=1364448
DOI: 10.1109/ICMECH.2004.1364448
BibTex Citekey: 6467
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Title: IEEE International Conference on Mechatronics (ICM '04)
Place of Event: Istanbul, Turkey
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Title: IEEE International Conference on Mechatronics (ICM '04)
Source Genre: Proceedings
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Publ. Info: Piscataway, NJ, USA : IEEE Operations Center
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 255 - 260 Identifier: -