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  Macro Defect Inspection of TFT-LCD Color Filter Glass: System and Algorithm

Son, H., Kim HW, Lee, H., & Jeong, D. (2005). Macro Defect Inspection of TFT-LCD Color Filter Glass: System and Algorithm. In EOS Conference on Industrial Imaging and Machine Vision (pp. 129-130). Hannover, Germany: European Optical Society.

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 Creators:
Son, HI1, Author           
Kim HW, Lee, HH, Author
Jeong, DH, Author
Affiliations:
1Department Human Perception, Cognition and Action, Max Planck Institute for Biological Cybernetics, Max Planck Society, ou_1497797              

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 Dates: 2005-06
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISBN: 3-00-016361-1
BibTex Citekey: 6466
 Degree: -

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Title: EOS Conference on Industrial Imaging and Machine Vision
Place of Event: München, Germany
Start-/End Date: -

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Title: EOS Conference on Industrial Imaging and Machine Vision
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Hannover, Germany : European Optical Society
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 129 - 130 Identifier: -