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  Supervised Probabilistic Principal Component Analysis

Yu, S., Yu K, Tresp V, Kriegel, H.-P., & Wu, M. (2006). Supervised Probabilistic Principal Component Analysis. Proceedings of the 12th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (KDD 2006), 464-473.

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Yu, S, Author
Yu K, Tresp V, Kriegel, H-P, Author
Wu, M1, Author           
Ungar, L., Editor
Affiliations:
1Department Empirical Inference, Max Planck Institute for Biological Cybernetics, Max Planck Society, ou_1497795              

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 Abstract: Principal component analysis (PCA) has been extensively applied in data mining, pattern recognition and information retrieval for unsupervised dimensionality reduction. When labels of data are available, e.g.,~in a classification or regression task, PCA is however not able to use this information. The problem is more interesting if only part of the input data are labeled, i.e.,~in a semi-supervised setting. In this paper we propose a supervised PCA model called SPPCA and a semi-supervised PCA model called S^2PPCA, both of which are extensions of a probabilistic PCA model. The proposed models are able to incorporate the label information into the projection phase, and can naturally handle multiple outputs (i.e.,~in multi-task learning problems). We derive an efficient EM learning algorithm for both models, and also provide theoretical justifications of the model behaviors. SPPCA and S^2PPCA are compared with other supervised projection methods on various learning tasks, and show not only promising performance but also good scalability.

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 Dates: 2006-08
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: URI: http://portal.acm.org/citation.cfm?id=1150454
DOI: 10.1145/1150402.1150454
BibTex Citekey: 4069
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Title: 12th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining
Place of Event: Philadelphia, PA, USA
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Title: Proceedings of the 12th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining (KDD 2006)
Source Genre: Journal
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Publ. Info: New York, NY, USA : ACM Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 464 - 473 Identifier: -