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  Semi-supervised Remote Sensing Image Classification via Maximum Entropy

Erkan, A., Camps-Valls, G., & Altun, Y. (2010). Semi-supervised Remote Sensing Image Classification via Maximum Entropy. In 2010 IEEE International Workshop on Machine Learning for Signal Processing (MLSP 2010) (pp. 313-318). Piscataway, NJ, USA: IEEE.

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Erkan, AN1, Autor           
Camps-Valls, G1, Autor           
Altun, Y1, Autor           
Affiliations:
1Department Empirical Inference, Max Planck Institute for Biological Cybernetics, Max Planck Society, ou_1497795              

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 Zusammenfassung: Remote sensing image segmentation requires multi-category classification typically with limited number of labeled training samples. While semi-supervised learning (SSL) has emerged as a sub-field of machine learning to tackle the scarcity of labeled samples, most SSL algorithms to date have had trade-offs in terms of scalability and/or applicability to multi-categorical data. In this paper, we evaluate semi-supervised logistic regression (SLR), a recent information theoretic semi-supervised algorithm, for remote sensing image classification problems. SLR is a probabilistic discriminative classifier and a specific instance of the generalized maximum entropy framework with a convex loss function. Moreover, the method is inherently multi-class and easy to implement. These characteristics make SLR a strong alternative to the widely used semi-supervised variants of SVM for the segmentation of remote sensing images. We demonstrate the competitiveness of SLR in multispectral, hyperspectral and radar image classifica tion.

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 Datum: 2010-09
 Publikationsstatus: Erschienen
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 Identifikatoren: URI: http://mlsp2010.conwiz.dk/
DOI: 10.1109/MLSP.2010.5589199
BibTex Citekey: 6619
 Art des Abschluß: -

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Titel: 2010 IEEE International Workshop on Machine Learning for Signal Processing (MLSP 2010)
Veranstaltungsort: Kittilä, Finland
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Titel: 2010 IEEE International Workshop on Machine Learning for Signal Processing (MLSP 2010)
Genre der Quelle: Konferenzband
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Affiliations:
Ort, Verlag, Ausgabe: Piscataway, NJ, USA : IEEE
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 313 - 318 Identifikator: -