Electrical tip-sample contact in scanning conductive torsion mode

Weber, Stefan A. L.; Berger, Rüdiger

doi:10.1063/1.4802725

Local TagsRelease HistoryDetailsSummary

Electrical tip-sample contact in scanning conductive torsion mode

Weber, S. A. L., & Berger, R. (2013). Electrical tip-sample contact in scanning conductive torsion mode. Applied Physics Letters, 102(16): 163105. doi:10.1063/1.4802725.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0013-A65B-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-4B96-3

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Weber, Stefan A. L.¹, Author
Berger, Rüdiger¹, Author

Affiliations:
1Dept. Butt: Physics at Interfaces, MPI for Polymer Research, Max Planck Society, ou_1800286

Content

show

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2013

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: DOI: 10.1063/1.4802725

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Applied Physics Letters

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: Melville, NY : American Institute of Physics

Pages: - Volume / Issue: 102 (16) Sequence Number: 163105 Start / End Page: - Identifier: ISSN: 0003-6951
CoNE: https://pure.mpg.de/cone/journals/resource/954922836223