Exact I/O-linearization of chemical processes within a plant-wide quality 
control framework

Storz, M.; Gilles, Ernst Dieter

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Exact I/O-linearization of chemical processes within a plant-wide quality control framework

Storz, M., & Gilles, E. D. (1995). Exact I/O-linearization of chemical processes within a plant-wide quality control framework. In Proceedings of the 1995 American Control Conference: Vol. 1 (pp. 235-239). Piscataway: IEEE Service Center.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0013-A3DE-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-3BA2-2

Genre: Conference Paper

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Creators:
Storz, M., Author
Gilles, Ernst Dieter¹, Author

Affiliations:
1Other publications of the MPI staff, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738149

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Language(s): eng - English

Dates: Date issued: 1995

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 118237

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Title: American Control Conference ACC; 14

Place of Event: Seattle, USA

Start-/End Date: 1995-06-21 - 1995-06-23

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Title: Proceedings of the 1995 American Control Conference : Vol. 1

Source Genre: Proceedings

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Publ. Info: Piscataway : IEEE Service Center

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 235 - 239 Identifier: -