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  X-ray diffraction analysis of shape-memory transformations under load in Ni-Ti thin films

Schaab, J. (2012). X-ray diffraction analysis of shape-memory transformations under load in Ni-Ti thin films. Diploma Thesis, Universität Stuttgart, Stuttgrat.

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 Creators:
Schaab, J.1, 2, Author
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497644              
2Institut für Materialwissenschaft, Universität Stuttgart, Heisenbergstr. 3, 70569 Stuttgart, ou_persistent22              

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Free keywords: Abt. Mittemeijer
 Abstract: -

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Language(s): eng - English
 Dates: 2012-05-212012-05-21
 Publication Status: Issued
 Pages: -
 Publishing info: Stuttgrat : Universität Stuttgart
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: Diploma

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