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  Silicon Oxide Surface Segregation in CO Oxidation on Pd: An in situ PEEM, MS and XPS Study

Vogel, D., Budinska, Z., Spiel, C., Schlögl, R., Suchorski, Y., & Rupprechter, G. (2013). Silicon Oxide Surface Segregation in CO Oxidation on Pd: An in situ PEEM, MS and XPS Study. Catalysis Letters, 143(3), 235-240. doi:10.1007/s10562-012-0955-5.

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 Creators:
Vogel, Diana1, 2, Author           
Budinska, Z.1, Author
Spiel, Christian1, Author
Schlögl, Robert2, Author           
Suchorski, Yuri1, Author
Rupprechter, Günther1, Author           
Affiliations:
1Vienna University of Technology, Institute of Materials Chemistry, ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: CO oxidation; Polycrystalline Pd foil; Si segregation; Si oxide formation; Photoemission electron microscopy, X-ray photoelectron spectroscopy
 Abstract: The effect of silicon oxide surface segregation on the locally-resolved kinetics of the CO oxidation reaction on individual grains of a polycrystalline Pd foil was studied in situ by PEEM, MS and XPS. The silicon oxide formation induced by Si-impurity segregation at oxidizing conditions, was monitored by XPS and its impact on the global and local (spatially resolved) kinetics of the CO oxidation was determined by MS and PEEM. The results reveal a drastic inhibiting effect of silicon oxide on the Pd reactivity towards CO oxidation, manifested both in the collapse of the global CO2 formation rate and in the modified local reactive properties of individual Pd micrograins. The presence of adsorbed oxygen on the Pd surface effectively enhances the silicon segregation to the Pd surface.

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Language(s): eng - English
 Dates: 2013-01-082013-03-01
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1007/s10562-012-0955-5
 Degree: -

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Title: Catalysis Letters
Source Genre: Journal
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Publ. Info: New York : Springer
Pages: - Volume / Issue: 143 (3) Sequence Number: - Start / End Page: 235 - 240 Identifier: ISSN: 1011-372X
CoNE: https://pure.mpg.de/cone/journals/resource/954925586300