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  Interface Exploring of Tungsten Carbide-Stainless Steel Composites through HRTEM

Fernandes, C. M., Willinger, M. G., Vieira, M. T., & Senos, A. M. d. O. R. (2012). Interface Exploring of Tungsten Carbide-Stainless Steel Composites through HRTEM. Microscopy and Microanalysis, 18(S5), 109-110. doi:10.1017/S1431927612013207.

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Microscopy-Microanalysis.pdf (Verlagsversion), 155KB
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 Urheber:
Fernandes, C. M.1, Autor
Willinger, Marc Georg2, Autor           
Vieira, M. T.3, Autor
Senos, Ana Maria de Oliviera Rocha1, Autor
Affiliations:
1CICECO, Department of Ceramics and Glass Engineering, University of Aveiro, 3810-193 Aveiro, Portugal, ou_persistent22              
2Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              
3CEMUC, Mechanical Engineering, University of Coimbra, Rua Luís Reis Santos, Pinhal de Marrocos, 3030-788 Coimbra, Portugal, ou_persistent22              

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 Zusammenfassung: Composites of tungsten carbide (WC) and stainless steel (SS) have been produced through an innovative powder coating technique using sputtering. These composites showed remarkable mechanical properties after vacuum sintering, in spite of significant amounts of brittle eta-phase, (M,W)6C. The formation of eta-phase is almost inevitable, because it is thermodynamically favoured for stoichiometric C in the WC-SS system and accelerated in the SS coated WC particles, due to the reduced diffusion distances between WC and SS and the nanocrystalline character of the metallic coating. Surprisingly, the mechanical properties are not seriously affected by the eta-phase. In fact, relatively tough and harder materials have been obtained compared to similar compositions of WC-Co. In order to understand the microscopic reason for the reported mechanical strength, in-depth structural analysis of grain boundaries and interfaces was performed by electron microscopy.

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Sprache(n): eng - English
 Datum: 20122012-09-282012-08
 Publikationsstatus: Erschienen
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 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1017/S1431927612013207
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Titel: Microscopy and Microanalysis
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: New York, NY : Springer-Verlag New York
Seiten: - Band / Heft: 18 (S5) Artikelnummer: - Start- / Endseite: 109 - 110 Identifikator: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414