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  In-situ atomic resolution high-voltage electron microscopy

Phillipp, F., Lee, S. B., & Merkle, K. L. (2004). In-situ atomic resolution high-voltage electron microscopy. In Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy (8APEM) (pp. 653-654). Japanese Society for Electron Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-8037-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-8039-4
Genre: Conference Paper

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 Creators:
Phillipp, F.1, Author           
Lee, S. B.1, Author           
Merkle, K. L.2, Author
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Materials Sciende Division, Argonne National Laboratory, Argonne, Illinois, USA, ou_persistent22              

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Free keywords: MPI für Intelligente Systeme; Ehem. Abt. Rühle;
 Abstract: -

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Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 8th Asia-Pacific Conference on Electron Microscopy (8APEM)
Place of Event: Kanzawa, Japan
Start-/End Date: 2004-06-07 - 2004-06-11

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Title: Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy (8APEM)
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Japanese Society for Electron Microscopy
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 653 - 654 Identifier: -