X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV 
spectral range at the LULI 2000 laser facility

Reverdin, Charles; Thais, Frederic; Loisel, Guillaume; Busquet, M.; Bastiani-Ceccotti, S.; Blenski, T.; Caillaud, T.; Ducret, J. E.; Fölsner, Walter; Gilles, D.; Gilleron, F.; Pain, J. C.; Poirier, M.; Serres, F.; Silvert, V.; Soullie, G.; Turck-Chieze, S.; Villette, B.

doi:10.1063/1.4740266

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X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility

Reverdin, C., Thais, F., Loisel, G., Busquet, M., Bastiani-Ceccotti, S., Blenski, T., et al. (2012). X-ray grating spectrometer for opacity measurements in the 50 eV to 250 eV spectral range at the LULI 2000 laser facility. Review of scientific instruments, 83(10): 10E134. doi:10.1063/1.4740266.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-7974-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000E-7976-6

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Creators:
Reverdin, Charles¹, Author
Thais, Frederic¹, Author
Loisel, Guillaume¹, Author
Busquet, M.¹, Author
Bastiani-Ceccotti, S.¹, Author
Blenski, T.¹, Author
Caillaud, T.¹, Author
Ducret, J. E.¹, Author
Fölsner, Walter², Author
Gilles, D.¹, Author
Gilleron, F.¹, Author
Pain, J. C.¹, Author
Poirier, M.¹, Author
Serres, F.¹, Author
Silvert, V.¹, Author
Soullie, G.¹, Author
Turck-Chieze, S.¹, Author
Villette, B.¹, Author

Affiliations:
1external, ou_persistent22
2Laboratory for Attosecond Physics, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445564

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Language(s): eng - English

Dates: Created: 2012-10Published Online: 2012-08-24Date issued: 2012-10

Publication Status: Issued

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Rev. Type: Peer

Identifiers: ISI: 000311562900142
DOI: 10.1063/1.4740266
URI: http://rsi.aip.org/resource/1/rsinak/v83/i10/p10E134_s1
Other: 4444

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Title: Review of scientific instruments

Source Genre: Journal

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Publ. Info: College Park, Maryland : American Institute of Physics

Pages: - Volume / Issue: 83 (10) Sequence Number: 10E134 Start / End Page: - Identifier: ISSN: 0034-6748