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  GRAVITY: metrology

Gillessen, S., Lippa, M., Eisenhauer, F., Pfuhl, O., Haug, M., Kellner, S., et al. (2012). GRAVITY: metrology. In F. Delplancke, J. K. Rajagopal, & F. Malbet (Eds.), Optical and Infrared Interferometry III (pp. 1-9).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-8DB5-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-8DB6-B
Genre: Conference Paper

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 Creators:
Gillessen, Stefan1, Author           
Lippa, Magdalena1, Author           
Eisenhauer, Frank1, Author           
Pfuhl, Oliver1, Author           
Haug, Marcus1, Author           
Kellner, Stefan1, Author           
Ott, Thomas1, Author           
Wieprecht, Ekkehard1, Author           
Sturm, Eckhard1, Author           
Haußmann, Frank1, Author           
Kister, Clemens F.1, Author           
Moch, David1, Author           
Thiel, Markus1, Author           
Affiliations:
1Infrared and Submillimeter Astronomy, MPI for Extraterrestrial Physics, Max Planck Society, ou_159889              

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Language(s): eng - English
 Dates: 2012
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1117/12.926813
Other: LOCALID: AS 22/227 I, pp.84451O
 Degree: -

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Title: Optical and Infrared Interferometry III
Place of Event: Amsterdam, The Netherlands
Start-/End Date: 2012-07-01 - 2012-07-06

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Title: Optical and Infrared Interferometry III
Source Genre: Proceedings
 Creator(s):
Delplancke, Francoise, Editor
Rajagopal, Jayadev K., Editor
Malbet, Fabien, Editor
Affiliations:
-
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: 84451O Start / End Page: 1 - 9 Identifier: ISBN: 978-0-8194-9146-6

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Title: Proceedings of SPIE
Source Genre: Series
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Publ. Info: Bellingham, WA, USA : Society of Photo-Optical Instrumentation Engineers
Pages: - Volume / Issue: 8445 (Part One) Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X