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Free keywords:
Single-particle electron cryo-microscopy, Beam-induced movement, Radiation damage, Dose-rate effect, High-resolution EM
Abstract:
A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as “bubbling”. The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.
