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  Comparative-study of a regular protein layer by scanning tunneling microscopy and transmission electron-microscopy

Amrein, M., Wang, Z., & Guckenberger, R. (1991). Comparative-study of a regular protein layer by scanning tunneling microscopy and transmission electron-microscopy. Journal of Vacuum Science & Technology B-Microelectronics Processing and Phenomena, 9(N2), 1276-1281.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-7431-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-7432-9
Genre: Journal Article

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Amrein, M., Author
Wang, Z., Author
Guckenberger, R.1, Author           
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1External Organizations, ou_persistent22              

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Free keywords: BIO
 Abstract: M

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 Dates: 1991
 Publication Status: Issued
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 Identifiers: eDoc: 318690
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Title: Journal of Vacuum Science & Technology B-Microelectronics Processing and Phenomena
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 9 (N2) Sequence Number: - Start / End Page: 1276 - 1281 Identifier: -