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  Scanning microscopy by mid-infrared near-field scattering

Knoll, B., & Keilmann, F. (1998). Scanning microscopy by mid-infrared near-field scattering. Applied Physics A (Materials Science Processing), 66(5), 477-481.

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Knoll, B., Author
Keilmann, F.1, Author           
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Free keywords: Resolution.; Applied physics/condensed matter/materials science.
 Abstract: We investigate mid-infrared imaging of dielectric and metallic surfaces by an ''apertureless'' SNOM approach of scattering CO2-laser radiation from an AFM tip. In the microscopic images we find and identify a new type of AFM-induced artifact (crosstalk via the tapping amplitude). Minimizing this by proper scan parameters we obtain evidence of true infrared contrast. The results demonstrate the material-sensitive potential of infrared-spectroscopic imaging and a spatial resolving power of better than 100 nm. [References: 12]

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 Dates: 1998-05
 Publication Status: Issued
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 Identifiers: eDoc: 318684
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Title: Applied Physics A (Materials Science Processing)
Source Genre: Journal
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Pages: - Volume / Issue: 66 (5) Sequence Number: - Start / End Page: 477 - 481 Identifier: -