English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
 Local TagsRelease HistoryDetailsSummary
  Nonlinear Anisotropic Diffusion in Three-dimensional Electron Microscopy. In:

Frangakis, A., & Hegerl, R. (1999). Nonlinear Anisotropic Diffusion in Three-dimensional Electron Microscopy. In:. In G. G. Leeuwen, J. Hartmanis, & J. van (Eds.), Lecture Notes in Computer Science (pp. 386-397). Berlin: Springer Verlag.

Item is

 

show all hide all

Basic

show hide
Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-71C9-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-71CA-D
Genre: Book Chapter

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Frangakis, A.S., Author
Hegerl, R.1, Author           
Affiliations:
1External Organizations, ou_persistent22              

Content

show
hide
Free keywords: -
 Abstract: Electron tomography is a powerful tool for investigating the three-dimensional (3d) structure of biological objects at a resolution in the nanometer range. however, visualization and interpretation of the resulting volumetric data is a very difficult task due to the extremely low signal to noise ratio (<0db). in this paper, an approach for noise reduction in volumetric data is presented, based on nonlinear anisotropic diffusion, using a hybrid of the edge enhancing and the coherence enhancing techniques. when applied to both, artificial or real data sets, the method turns out to be superior to conventional filters. in order to assess noise reduction and structure preservation experimentally, resolution tests commonly used in structure analysis are applied to the data in the frequency domain.

Details

show
hide
Language(s):
 Dates: 1999
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 318681
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Lecture Notes in Computer Science
Source Genre: Book
 Creator(s):
Leeuwen, G. Goos, Editor
Hartmanis, J., Editor
van, J., Editor
Affiliations:
-
Publ. Info: Berlin : Springer Verlag
Pages: - Volume / Issue: 1682 Sequence Number: - Start / End Page: 386 - 397 Identifier: -