Infrared conductivity mapping for nanoelectronics

Knoll, B.; Keilmann, F.

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Infrared conductivity mapping for nanoelectronics

Knoll, B., & Keilmann, F. (2000). Infrared conductivity mapping for nanoelectronics. Applied Physics Letters, 77(24), 3980-3982.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-7185-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-7186-7

Genre: Journal Article

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Knoll, B., Author
Keilmann, F.¹, Author

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Free keywords: Microscopy; Resolution.; Applied Physics/Condensed Matter/Materials Science in Current Contents(R)/Physical, Chemical & Earth Sciences.; SNOM-XSAMP; S-SNOM

Abstract: near and field and microscop backsearch

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Dates: Date issued: 2000

Publication Status: Issued

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Identifiers: eDoc: 318618

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Title: Applied Physics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 77 (24) Sequence Number: - Start / End Page: 3980 - 3982 Identifier: -