Enhanced dielectric contrast in scattering-type scanning near-field optical 
microscopy

Knoll, B.; Keilmann, F.

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Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy

Knoll, B., & Keilmann, F. (2000). Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy. Optics Communications, 182(4-6), 321-328.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-717F-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-7180-4

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Knoll, B., Author
Keilmann, F.¹, Author

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Free keywords: Resolution; Microwave; Diode.; Applied Physics/Condensed Matter/Materials Science in Current Contents(R)/Physical, Chemical & Earth Sciences. Optics & Acoustics in Current Contents(R)/Engineering, Computing & Technology.

Abstract: Ovid-processing week 38/00

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Dates: Date issued: 2000

Publication Status: Issued

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Title: Optics Communications

Source Genre: Journal

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Pages: - Volume / Issue: 182 (4-6) Sequence Number: - Start / End Page: 321 - 328 Identifier: -