English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy

Hillenbrand, R., & Keilmann, F. (2002). Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy. Applied Physics Letters, 80(1), 25-27.

Item is

Basic

show hide
Genre: Journal Article
Alternative Title : Appl. Phys. Lett.

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Hillenbrand, R.1, Author           
Keilmann, F.1, Author           
Affiliations:
1Baumeister, Wolfgang / Molecular Structural Biology, Max Planck Institute of Biochemistry, Max Planck Society, ou_1565142              

Content

show
hide
Free keywords: -
 Abstract: We report that three main constituents of nanosystems-metals, semiconductors, and dielectrics-can be categorically distinguished by their specific optical near-field contrast at 633 nm wavelength. The decisive property is the local dielectric constant as we show by calculations based on dipolar coupling theory. Experiments with Au/Si/PS(polystyrene) nanostructures using an apertureless scattering-type near-field optical microscope yield optical images at 10 nm resolution, with clear material contrast close to predicted levels. (C) 2002 American Institute of Physics.

Details

show
hide
Language(s): eng - English
 Dates: 2002-01-07
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 35022
ISI: 000173029000009
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Applied Physics Letters
  Alternative Title : Appl. Phys. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 80 (1) Sequence Number: - Start / End Page: 25 - 27 Identifier: ISSN: 0003-6951