Quantitative X-ray diffraction analysis and modeling of the crystallization 
process in amorphous Si-B-C-N polymer derived ceramics

Tavakoli, A. H.; Gerstel, P.; Golczewski, J. A.; Bill, J.

doi:10.1111/j.1551-2916.2009.03591.x

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Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics

Tavakoli, A. H., Gerstel, P., Golczewski, J. A., & Bill, J. (2010). Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics. Journal of the American Ceramic Society, 93, 1470-1478. doi:10.1111/j.1551-2916.2009.03591.x.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4F6B-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4F6C-0

Genre: Journal Article

Alternative Title : J. Am. Ceram. Soc.

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Creators:
Tavakoli, A. H.¹, Author
Gerstel, P.¹, Author
Golczewski, J. A.¹, Author
Bill, J.², Author

Affiliations:
1Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497654
2Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Aldinger;

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Language(s): eng - English

Dates: Date issued: 2010-05

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 534112
DOI: 10.1111/j.1551-2916.2009.03591.x

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Title: Journal of the American Ceramic Society

Alternative Title : J. Am. Ceram. Soc.

Source Genre: Journal

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Pages: - Volume / Issue: 93 Sequence Number: - Start / End Page: 1470 - 1478 Identifier: -