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  Valence-band and chemical-state analyses of Zr and O in thermally grown thin zirconium-oxide films: an XPS study

Bakradze, G., Jeurgens, L. P. H., & Mittemeijer, E. J. (2011). Valence-band and chemical-state analyses of Zr and O in thermally grown thin zirconium-oxide films: an XPS study. The Journal of Physical Chemistry C, 115, 19841-19848. doi:10.1021/jp206896m.

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 Creators:
Bakradze, G.1, Author           
Jeurgens, L. P. H.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Intelligente Systeme; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 579769
DOI: 10.1021/jp206896m
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Title: The Journal of Physical Chemistry C
Source Genre: Journal
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Pages: - Volume / Issue: 115 Sequence Number: - Start / End Page: 19841 - 19848 Identifier: -