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  Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy

Wang, Z. M., Gu, L., Jeurgens, L. P. H., & Mittemeijer, E. J. (2011). Thermal stability of Al/nanocrystalline-Si bilayers investigated by in situ heating energy-filtered transmission electron microscopy. Journal of Materials Science, 46(12), 4314-4317. doi:10.1007/s10853-011-5299-9.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4DA2-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4DA3-2
Genre: Journal Article
Alternative Title : J. Mater Sci.

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 Creators:
Wang, Z. M.1, Author           
Gu, L.2, Author           
Jeurgens, L. P. H.1, Author           
Mittemeijer, E. J.1, 3, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
3Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM); Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 563004
DOI: 10.1007/s10853-011-5299-9
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Title: Journal of Materials Science
  Alternative Title : J. Mater Sci.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 46 (12) Sequence Number: - Start / End Page: 4314 - 4317 Identifier: -