High-resolution core-level spectroscopy study of the ultrathin aluminum oxide 
film on NiAl(110)

Martin, N. M.; Knudsen, J.; Blomberg, S.; Gustafson, J.; Andersen, J. N.; Ingelsten, H.; Carlsson, P.-A.; Skoglundh, M.; Stierle, A.; Kresse, G.

doi:10.1103/PhysRevB.83.125417

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High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110)

Martin, N. M., Knudsen, J., Blomberg, S., Gustafson, J., Andersen, J. N., Ingelsten, H., et al. (2011). High-resolution core-level spectroscopy study of the ultrathin aluminum oxide film on NiAl(110). Physical Review B, 83: 125417. doi:10.1103/PhysRevB.83.125417.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4D30-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4D31-F

Genre: Journal Article

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Creators:
Martin, N. M.¹, Author
Knudsen, J.¹, Author
Blomberg, S.¹, Author
Gustafson, J.¹, Author
Andersen, J. N.¹, Author
Ingelsten, H.¹, Author
Carlsson, P.-A.¹, Author
Skoglundh, M.¹, Author
Stierle, A.², Author
Kresse, G.¹, Author

Affiliations:
1Division of Synchrotron Radiation Research, Lund University, Box 118, SE-22100 Sweden; Competence Center for Catalysis, Chalmers Universtiy of Technology, SE-41296 Göteborg, Sweden; Arbeitsgruppe Festkörperphysik, Grenzflächen Fachbereich 7 Physik, Universität Siegen, Walter-Flex-Str. 3, 57072 Siegen; Institut für Materialphysik, Universität Wien, A-1090 Wien, Austria, ou_persistent22
2Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497651

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Free keywords: MPI für Intelligente Systeme; Abt. Dosch/Rühle;

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Language(s): eng - English

Dates: Date issued: 2011-03-22

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 563154
DOI: 10.1103/PhysRevB.83.125417

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Title: Physical Review B

Source Genre: Journal

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Pages: - Volume / Issue: 83 Sequence Number: 125417 Start / End Page: - Identifier: -