Characterization of strained semiconductor structures using transmission 
electron microscopy

Özdöl, V. B.

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Characterization of strained semiconductor structures using transmission electron microscopy

Özdöl, V. B. (2011). Characterization of strained semiconductor structures using transmission electron microscopy. PhD Thesis, Christian-Abrechts-Universität zu Kiel, Kiel.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4C83-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-39DC-1

Genre: Thesis

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Creators:
Özdöl, V. B.¹, Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Accepted: 2011-07-25

Publication Status: Accepted / In Press

Pages: 118 pages

Publishing info: Kiel : Christian-Abrechts-Universität zu Kiel

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 580542
URI: http://macau.uni-kiel.de/servlets/MCRFileNodeServlet/dissertation_derivate_00003953/Burak_Ozdol_Thesis_Final_Vrs.pdf?hosts=
URN: urn:nbn:de:gbv:8-diss-68563

Degree: PhD

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