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  Determining thermodynamic and structural parameters of thin amorphous intergranular films by electron diffraction

Koch, C. T., Bhattacharyya, S., Subramaniam, A., & Rühle, M. (2004). Determining thermodynamic and structural parameters of thin amorphous intergranular films by electron diffraction. In Proceedings of the 13th European Microscopy Congress, Vol. 2 (pp. 37-38). Belgian Society for Microscopy.

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 Creators:
Koch, C. T.1, 2, Author           
Bhattacharyya, S.1, Author           
Subramaniam, A.1, Author           
Rühle, M.1, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle; Stuttgart Center for Electron Microscopy
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Language(s): eng - English
 Dates: 2004
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 288647
 Degree: -

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Title: 13th European Microscopy Congress
Place of Event: Antwerpen [Belgium]
Start-/End Date: 2004-08-22 - 2004-08-27

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Title: Proceedings of the 13th European Microscopy Congress, Vol. 2
Source Genre: Proceedings
 Creator(s):
Affiliations:
Publ. Info: Belgian Society for Microscopy
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 37 - 38 Identifier: -