"Bulge-Test" an freistehenden Kupferschichten

Onuseit, Felix

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"Bulge-Test" an freistehenden Kupferschichten

Onuseit, F. (2005). "Bulge-Test" an freistehenden Kupferschichten. Diploma Thesis, University of Stuttgart, Stuttgart.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-492F-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4930-D

Genre: Thesis

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Creators:
Onuseit, Felix¹, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655

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Free keywords: MPI für Intelligente Systeme; Ehemalige Abt. Arzt;

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Language(s): deu - German

Dates: Accepted: 2005-02-25

Publication Status: Accepted / In Press

Pages: -

Publishing info: Stuttgart : University of Stuttgart

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 263192

Degree: Diploma

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