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  AES depth profiling and interface analysis of C/Ta bilayers

Zalar, A., Kovac, J., Pracek, B., Hofmann, S., & Panjan, P. (2005). AES depth profiling and interface analysis of C/Ta bilayers. Applied Surface Science, 252(5), 2056-2062.

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Genre: Journal Article
Alternative Title : Appl. Surf. Sci.

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 Creators:
Zalar, A.1, Author
Kovac, J.1, Author
Pracek, B.1, Author
Hofmann, S.2, Author           
Panjan, P.1, Author
Affiliations:
1Jozef Stefan Inst, Ljubljana 1000, Slovenia, ou_persistent22              
2Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
 Abstract: -

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Language(s): eng - English
 Dates: 2005-12-15
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 367988
ISI: 000233985900107
 Degree: -

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Title: Applied Surface Science
  Alternative Title : Appl. Surf. Sci.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 252 (5) Sequence Number: - Start / End Page: 2056 - 2062 Identifier: ISSN: 0169-4332