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  Requisites for ultimate energy resolution EELS and band gap measurements

Essers, E., Höschen, R., Matijevic, M., Benner, G., & Koch, C. T. (2006). Requisites for ultimate energy resolution EELS and band gap measurements. Microscopy and Microanalysis, 12(Suppl. 2: Proceedings), 1148-1149.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-48A2-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-48A3-4
Genre: Conference Paper

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 Creators:
Essers, E.1, Author
Höschen, R.2, 3, Author           
Matijevic, M.1, Author
Benner, G.1, Author
Koch, C. T.2, 3, Author           
Affiliations:
1Carl Zeiss NTS GmbH, Carl-Zeiss-Straße 56, 73447 Oberkochen, Germany, ou_persistent22              
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
 Abstract: -

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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 378649
 Degree: -

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Title: Microscopy and Microanalysis 2006
Place of Event: Chicago, IL, USA
Start-/End Date: 2006-07-30 - 2006-08-03

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Title: Microscopy and Microanalysis
Source Genre: Journal
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Publ. Info: Canbridge, UK : Cambridge University Press
Pages: - Volume / Issue: 12 (Suppl. 2: Proceedings) Sequence Number: - Start / End Page: 1148 - 1149 Identifier: -