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  Bonding at copper-alumina interfaces established by different surface treatments: a critical review

Scheu, C., Gao, M., Oh, S. H., Dehm, G., Klein, S., Tomsia, A. P., et al. (2006). Bonding at copper-alumina interfaces established by different surface treatments: a critical review. Journal of Materials Science, 41(16), 5161-5168. doi:101007/s10853-006-0073-0.

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 Creators:
Scheu, C.1, Author           
Gao, M.1, Author           
Oh, S. H.1, Author           
Dehm, G.2, Author           
Klein, S.1, Author           
Tomsia, A. P.1, Author           
Rühle, M.3, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
3Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Metallforschung; Emeriti and Others; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 318166
DOI: 101007/s10853-006-0073-0
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Title: Journal of Materials Science
Source Genre: Journal
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Pages: - Volume / Issue: 41 (16) Sequence Number: - Start / End Page: 5161 - 5168 Identifier: -