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  Depth dependence of elastic grain interaction and mechanical stress: analysis by X-ray diffraction measurements at fixed-penetration/information depths

Kumar, A., Welzel, U., & Mittemeijer, E. J. (2006). Depth dependence of elastic grain interaction and mechanical stress: analysis by X-ray diffraction measurements at fixed-penetration/information depths. Journal of Applied Physics, 100: 114904.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4850-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4851-B
Genre: Journal Article

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481.pdf (Abstract), 12KB
 
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 Creators:
Kumar, A.1, Author           
Welzel, U.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 299485
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Title: Journal of Applied Physics
Source Genre: Journal
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Pages: - Volume / Issue: 100 Sequence Number: 114904 Start / End Page: - Identifier: -