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  Quantitative analysis of multi-element oxide thin films by angle-resolved XPS: application to ultra-thin oxide films on MgAl substrates

Jeurgens, L. P. H., Vinodh, M. S., & Mittemeijer, E. J. (2006). Quantitative analysis of multi-element oxide thin films by angle-resolved XPS: application to ultra-thin oxide films on MgAl substrates. Applied Surface Science, 253, 627-638.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-484D-A Version Permalink: http://hdl.handle.net/11858/00-001M-0000-0010-484E-8
Genre: Journal Article

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 Creators:
Jeurgens, L. P. H.1, Author              
Vinodh, M. S.1, Author              
Mittemeijer, E. J.1, 2, Author              
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, escidoc:1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, escidoc:persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Published in print
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 Rev. Method: Peer
 Identifiers: eDoc: 299483
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Title: Applied Surface Science
Source Genre: Journal
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Pages: - Volume / Issue: 253 Sequence Number: - Start / End Page: 627 - 638 Identifier: -