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  Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths

Wohlschlögel, M., Baumann, W., Welzel, U., & Mittemeijer, E. J. (2006). Mechanical stress gradients in thin films analyzed employing X-ray diffraction measurements at constant penetration/information depths.

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473.pdf (Abstract), 68KB
 
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 Creators:
Wohlschlögel, M.1, Author           
Baumann, W.1, Author           
Welzel, U.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
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 Rev. Type: Peer
 Identifiers: eDoc: 299451
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Title: Residual Stresses VII. Proceedings of the 7th European conferenc on Residual Stresses
Source Genre: Issue
 Creator(s):
Reimers, W., Editor
S., Quander, Editor
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 19 - 24 Identifier: -

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Title: Materials Science Forum
Source Genre: Journal
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Pages: - Volume / Issue: 524/525 Sequence Number: - Start / End Page: - Identifier: -