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  An X-ray diffraction method to determine stress at constant penetration/information depths

Kumar, A., Welzel, U., Wohlschlögel, M., Baumann, W., & Mittemeijer, E. J. (2006). An X-ray diffraction method to determine stress at constant penetration/information depths.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4835-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4836-B
Genre: Conference Paper

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472.pdf (Abstract), 67KB
 
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 Creators:
Kumar, A.1, Author           
Welzel, U.1, Author           
Wohlschlögel, M.1, Author           
Baumann, W.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 299445
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Title: Residual Stresses VII. Proceedings of the 7th European conferenc on Residual Stresses
Source Genre: Issue
 Creator(s):
Reimers, W., Editor
Quander, S., Editor
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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 13 - 18 Identifier: -

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Title: Materials Science Forum
Source Genre: Journal
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Pages: - Volume / Issue: 524-525 Sequence Number: - Start / End Page: - Identifier: -