EELS/ELNES and STEM inverstigations of Cu-rich layers and nanostructures formed 
by metal deposition on chalcogenide crystal surfaces

Hollensteiner, S.; Sigle, W.; Spiecker, E.; Jäger, W.

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EELS/ELNES and STEM inverstigations of Cu-rich layers and nanostructures formed by metal deposition on chalcogenide crystal surfaces

Hollensteiner, S., Sigle, W., Spiecker, E., & Jäger, W. (2006). EELS/ELNES and STEM inverstigations of Cu-rich layers and nanostructures formed by metal deposition on chalcogenide crystal surfaces. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1850-1850). International Federation of Societies in Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47E9-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47EA-E

Genre: Conference Paper

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Creators:
Hollensteiner, S., Author
Sigle, W.^{1, 2}, Author
Spiecker, E., Author
Jäger, W., Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; Zentrum für Transmissionslektronenmikroskopie;

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 287814

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Title: 16th International Microscopy Congress - IMC16

Place of Event: Sapporo, Japan

Start-/End Date: 2006-09-03 - 2006-09-08

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Title: Proceedings of the 16th International Microscopy Congress 2006

Source Genre: Proceedings

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Publ. Info: International Federation of Societies in Microscopy

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1850 - 1850 Identifier: -