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  EELS studies of the bandgap in GaN using monochromated electrons

Gu, L., Srot, V., Sigle, W., Koch, C. T., Scholz, F., Kirchner, C., et al. (2006). EELS studies of the bandgap in GaN using monochromated electrons. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1484-1484). International Federation of Societies in Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47DF-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47E0-2
Genre: Conference Paper

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 Creators:
Gu, L.1, Author           
Srot, V.1, Author           
Sigle, W.1, Author           
Koch, C. T.1, Author           
Scholz, F.2, Author
Kirchner, C.2, Author
Thapa, S. B.2, Author
Rühle, M.3, Author           
Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              
2Universität Ulm, Albert-Einstein-Allee 45, Ulm, Germany, ou_persistent22              
3Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650              

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;
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Language(s): eng - English
 Dates: 2006
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 287720
 Degree: -

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Title: 16th International Microscopy Congress - IMC16
Place of Event: Sapporo, Japan
Start-/End Date: 2006-09-03 - 2006-09-08

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Title: Proceedings of the 16th International Microscopy Congress 2006
Source Genre: Proceedings
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Affiliations:
Publ. Info: International Federation of Societies in Microscopy
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1484 - 1484 Identifier: -