Low-loss electron spectroscopy using monochromated electrons

Sigle, W.; Srot, V.; Gu, L.; Koch, C. T.; Höschen, R.; Essers, E.; Matijevic, M.; Benner, G.; Thesen, A.; Rühle, M.

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Low-loss electron spectroscopy using monochromated electrons

Sigle, W., Srot, V., Gu, L., Koch, C. T., Höschen, R., Essers, E., et al. (2006). Low-loss electron spectroscopy using monochromated electrons. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 811-811). International Federation of Societies in Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47DD-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-47DE-A

Genre: Conference Paper

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Creators:
Sigle, W.¹, Author
Srot, V.¹, Author
Gu, L.¹, Author
Koch, C. T.¹, Author
Höschen, R.¹, Author
Essers, E.², Author
Matijevic, M.², Author
Benner, G.², Author
Thesen, A.², Author
Rühle, M.³, Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
2Carl Zeiss GmbH, Carl-Zeiss-Str. 56, 73447 Oberkochen, Germany, ou_persistent22
3Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650

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Free keywords: MPI für Intelligente Systeme; Stuttgart Center for Electron Microscopy (StEM); Emeriti and Others;

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 287719

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Title: 16th International Microscopy Congress - IMC16

Place of Event: Sapporo, Japan

Start-/End Date: 2006-09-03 - 2006-09-08

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Title: Proceedings of the 16th International Microscopy Congress 2006

Source Genre: Proceedings

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Publ. Info: International Federation of Societies in Microscopy

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 811 - 811 Identifier: -